by Robert Schreiber
Berlin, Germany (SPX) Apr 16, 2026
Utilizing three-dimensional electron diffraction (3D ED), researchers at Friedrich-Alexander-Universitat (FAU) Erlangen-Nurnberg have demonstrated that electrons can present the averaged structural info beforehand accessible solely with X-rays. For the primary time, this permits a complete structural characterization of natural photo voltaic cells inside a single instrument – a transmission electron microscope.
“3D ED was the lacking piece we wanted to finish the electron microscopy toolbox,” mentioned Prof. Erdmann Spiecker, head of the Institute of Micro- and Nanostructure Analysis and the Middle for Nanoanalysis and Electron Microscopy (CENEM) at FAU, who led the undertaking.
On the coronary heart of the work is a direct comparability of electron and X-ray knowledge from equivalent samples. “It’s putting how nicely the info agree, regardless of the essentially completely different nature of electrons and X-rays,” mentioned Irene Kraus, who carried out the 3D ED experiments as a part of her doctoral analysis. The measurement geometries differ markedly: X-rays probe the pattern at shallow angles in reflection, whereas electrons cross by way of it. “In 3D ED, we tilt the pattern step-by-step, permitting us to reconstruct the common molecular order in three dimensions – very like tomography.”
A key problem within the work is radiation harm. Natural photo voltaic cells are extraordinarily beam-sensitive, and even low doses can disrupt their delicate molecular order. That is notably important for electrons, which work together strongly with matter and deposit power domestically. “At first look, electrons could appear unsuitable for such supplies,” mentioned Dr. Mingjian Wu, senior scientist at CENEM, who co-supervised the undertaking. “However with cautious dose management, we are able to extract structural info earlier than harm happens.” By optimizing the electron dose and creating tailor-made acquisition methods, the group was capable of reliably probe even extremely delicate nanocrystalline constructions whereas preserving the fabric.
The outcomes don’t diminish the position of X-ray methods. Moderately, the strategies are complementary. X-rays require minimal pattern preparation and are notably nicely fitted to in situ research of structural evolution throughout processing. Electron microscopy now uniquely combines averaged structural info with native imaging, diffraction imaging and chemical evaluation in a single instrument. “That is what we name multimodal microscopy,” defined Spiecker. “It permits us to instantly hyperlink various kinds of info – from molecular texture to native order and composition – inside one experiment.”
The analysis is related to 2 DFG-funded initiatives hosted at FAU: Analysis Coaching Group RTG 3103 “Correlative Supplies Microscopy” (CorMic), a doctoral program comprising 13 PhD tasks, and Collaborative Analysis Middle CRC 1719 “Subsequent-generation printed semiconductors: Atomic-level engineering by way of molecular floor chemistry” (ChemPrint). Each applications give attention to advancing multimodal and correlative microscopy of useful supplies.
Analysis Report:3D electron diffraction – the missing slice completing nanoscale analysis of organic solar cells in TEM
Associated Hyperlinks
University of Erlangen-Nuremberg
All About Solar Energy at SolarDaily.com
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